Editorial Cuvillier

Publicaciones, tesis doctorales, capacitaciónes para acceder a una cátedra de universidad & prospectos.
Su editorial internacional especializado en ciencias y economia

Editorial Cuvillier

De En Es
Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling

Impresion
EUR 19,00 EUR 18,05

E-Book
EUR 13,30

Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling (Volumen 3) (Tienda española)

A Festschrift for Peter Heymann

R. Doerner (Editor)
M. Rudolph (Editor)

Previo

Indice, Datei (27 KB)
Prologo, Datei (26 KB)
Lectura de prueba, Datei (150 KB)

This third volume of the Forschungsberichte presents a collection of nine technical papers on selected topics of microwave engineering, ranging from investigations of the plasma in a Tokamak to the modeling of Heterojunction Bipolar Transistors. The main focus, however, is on noise in transistors and circuits, and how to measure it. Eight of the contributions are original papers, and one is a reprint from Plasma Phys. Control. Fusion, it appears by courtesy of the Institute of Physics Publishing.

ISBN-10 (Impresion) 3865373283
ISBN-13 (Impresion) 9783865373281
ISBN-13 (E-Book) 9783736913288
Idioma Deutsch
Numero de paginas 130
Edicion 1 Aufl.
Serie Innovationen mit Mikrowellen und Licht. Forschungsberichte aus dem Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik
Volumen 3
Lugar de publicacion Göttingen
Fecha de publicacion 04.01.2005
Clasificacion simple Publicacion
Area Ingeniería mecánica y de proceso