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Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling

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EUR 19.00 EUR 18.05

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EUR 13.30

Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling (Volume 3)

A Festschrift for Peter Heymann

R. Doerner (Editor)
M. Rudolph (Editor)

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Table of Contents, Datei (27 KB)
Preface, Datei (26 KB)
Extract, Datei (150 KB)

ISBN-13 (Printausgabe) 3865373283
ISBN-13 (Hard Copy) 9783865373281
ISBN-13 (eBook) 9783736913288
Language Alemán
Page Number 130
Edition 1 Aufl.
Book Series Innovationen mit Mikrowellen und Licht. Forschungsberichte aus dem Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik
Volume 3
Publication Place Göttingen
Publication Date 2005-01-04
General Categorization Commemorative Publication
Departments Mechanical and process engineering
Description

This third volume of the Forschungsberichte presents a collection of nine technical papers on selected topics of microwave engineering, ranging from investigations of the plasma in a Tokamak to the modeling of Heterojunction Bipolar Transistors. The main focus, however, is on noise in transistors and circuits, and how to measure it. Eight of the contributions are original papers, and one is a reprint from Plasma Phys. Control. Fusion, it appears by courtesy of the Institute of Physics Publishing.