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Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling

R. Doerner – Author profile

Contributed to the following publications
Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling
Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling (Volume 3)
R. Doerner
Editor
M. Rudolph
Editor
ISBN-13 (Hard Copy): 978-3-86537-328-1
ISBN-13 (eBook): 978-3-73691-328-8
Price_print
EUR 19.00 EUR 18.05
Price_ebook
EUR 13.30
2005-01-04
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