Cookie Settings

Cookies are small text files that your web browser uses to save your so-called session. We use technically necessary cookies to be able to offer a comfortable booking process. In addition, you can help us to continuously optimize the booking portal by agreeing to our analytics cookies:

Allow Cookies

Disallow Cookies

View my cookie settings

De En Es
☰
Customer Support/Contact

Cuvillier Verlag

Publications, Dissertations, Habilitations & Brochures.
International Specialist Publishing House for Science and Economy

Cuvillier Verlag

De En Es
Departments
Book Series (92)
1308
Humanities
2293
Natural Sciences
5354
Engineering
1746
Common
91
Common 83
Equestrian sports 7
Leitlinien Unfallchirurgie
5. Auflage bestellen
Advanced Search
Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling

R. Doerner – Author profile

Contributed to the following publications
Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling
Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling (Volume 3)
R. Doerner
Editor
M. Rudolph
Editor
ISBN-13 (Hard Copy): 978-3-86537-328-1
ISBN-13 (eBook): 978-3-73691-328-8
Price_print
EUR 19.00 EUR 18.05
Price_ebook
EUR 13.30
2005-01-04
▲ nach oben springen